Experience in HBM ESD testing of high pin count devices.

Tilo Brodbeck Reinhold Gaertner

Published in: Microelectron. Reliab. (2007)

Keyphrases

high efficiency
mobile devices
neural network
knowledge base
web services
evolutionary algorithm
computer vision
similarity measure
data structure
learning environment
expert systems
virtual environment
test set
test data
user experience
electronic devices