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A New Cycle-consistent Adversarial Networks With Attention Mechanism for Surface Defect Classification With Small Samples.
Long Wen
You Wang
Xinyu Li
Published in:
IEEE Trans. Ind. Informatics (2022)
Keyphrases
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small samples
attention mechanism
defect classification
visual attention
sample size
model selection
accurate models
feature selection
multiscale
support vector
visual attention model
input image
human computer interaction
saliency map
regression trees