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A 36Gb/s Adaptive Baud-Rate CDR with CTLE and 1-Tap DFE in 28nm CMOS.

Danny YooMohammad BagherbeikWahid RahmanAli SheikholeslamiHirotaka TamuraTakayuki Shibasaki
Published in: ISSCC (2019)
Keyphrases
  • high speed
  • cmos technology
  • computer simulation
  • data sets
  • delay insensitive
  • metal oxide semiconductor