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A Demultiplexer Immune from Fabrication-Error Impairments as an Enabler of Compact High-Channel-Count (> 64 ch) Dense WDM Systems on Low-End Si PIC Platforms.

Tomoyuki AkiyamaShoichiro OdaSeok-Hwan JeongYasuhiro NakashaYu TanakaTakeshi Hoshida
Published in: OECC/PSC (2019)
Keyphrases
  • low end
  • high end
  • high speed
  • software engineering
  • prediction error
  • computing systems