A Demultiplexer Immune from Fabrication-Error Impairments as an Enabler of Compact High-Channel-Count (> 64 ch) Dense WDM Systems on Low-End Si PIC Platforms.
Tomoyuki AkiyamaShoichiro OdaSeok-Hwan JeongYasuhiro NakashaYu TanakaTakeshi HoshidaPublished in: OECC/PSC (2019)