Large Margin Metric Learning for Multi-Label Prediction.
Weiwei LiuIvor W. TsangPublished in: AAAI (2015)
Keyphrases
- multi label
- metric learning
- learning tasks
- multi label classification
- text categorization
- image classification
- distance metric
- multi task
- class labels
- labeled data
- semi supervised
- image annotation
- text classification
- binary classification
- graph cuts
- pairwise
- semi supervised learning
- distance function
- learning problems
- feature space
- learning algorithm
- transfer learning
- dimensionality reduction
- neural network
- k nearest neighbor
- knn
- learning process
- machine learning