Robust inference for one-shot device testing data under exponential lifetime model with multiple stresses.
Narayanaswamy BalakrishnanElena CastillaNirian MartínLeandro PardoPublished in: Qual. Reliab. Eng. Int. (2020)
Keyphrases
- data sets
- database
- experimental data
- simulation data
- image data
- high level
- measured data
- empirical data
- test data
- data collection
- measurement data
- mathematical model
- input data
- probability distribution
- prior knowledge
- data structure
- probabilistic model
- bayesian model
- data quality
- prior information
- raw data
- statistical methods
- network structure
- data acquisition
- data sources
- high dimensional
- xml documents
- computational model
- synthetic data
- data processing
- random fields
- objective function
- data mining techniques
- high quality
- inference process
- multiple models
- similarity measure
- neural network