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Polarization-Insensitive Laser Scanning and Profiling Using Amplitude-Modulated CW Scheme.
Chao Zhang
Sifan Liu
Neisei Hayashi
Sze Yun Set
Shinji Yamashita
Published in:
IEEE Trans. Instrum. Meas. (2020)
Keyphrases
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laser scanning
visual inspection
volume reconstruction
three dimensional
microscopy images