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Built-in self test applicability for the non-linear operations of Advanced Encryption Standard.

Flavius OpritoiuMircea VladutiuLucian ProdanMihai Udrescu
Published in: SACI (2009)
Keyphrases
  • advanced encryption standard
  • encryption algorithms
  • data encryption standard
  • built in self test
  • digital libraries
  • lightweight
  • integrated circuit