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Determining GaInP/GaAs HBT Device Structure by DC Measurements on a Two-Emitter HBT Device and High Frequency Transit Time Measurements.
Chinchun Meng
Bo-Chen Tsou
Sheng-Che Tseng
Published in:
IEICE Trans. Electron. (2005)
Keyphrases
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high frequency
low frequency
measurement data
subband
high resolution
wavelet transform
visual quality
field effect transistors
high frequencies
high density
low pass
image compression
bit rate
high frequency components
room temperature
multi resolution analysis
phase shifting
image data