A Test Response Compression Method for Monolithic 3-D ICs Based on 3-D Haar Wavelet Transforms.
Jing HuYuheng LinMing HuHongjian WangPublished in: IEEE Trans. Instrum. Meas. (2021)
Keyphrases
- high precision
- high accuracy
- test data
- high order
- image compression
- computational cost
- detection method
- dynamic programming
- preprocessing
- similarity measure
- cost function
- significant improvement
- neural network
- probabilistic model
- pairwise
- clustering method
- segmentation method
- basis functions
- feature extraction
- image segmentation
- image processing