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Formal Validation and Verification of Atomic Resolution Microscope Control and Topography.

Joaquín NicolásJosé Ambrosio Toval ÁlvarezAurelio ArenasJuan Alcalde
Published in: Cybern. Syst. (2001)
Keyphrases
  • formal methods
  • formal analysis
  • high resolution
  • control system
  • visual inspection
  • database
  • model checking
  • control strategy
  • control method
  • face verification
  • data acquisition
  • control strategies