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The impact of intra-die device parameter variations on path delays and on the design for yield of low voltage digital circuits.
M. Eisele
Jörg Berthold
Doris Schmitt-Landsiedel
R. Mahnkopf
Published in:
ISLPED (1996)
Keyphrases
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digital circuits
low voltage
circuit design
design considerations
model based diagnosis
mixed signal
functional decomposition