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Detecting Defects in Photovoltaic Cells and Panels and Evaluating the Impact on Output Performances.

Christian SchussKimmo LeppanenKari RemesJuha SaarelaTapio FabritiusBernd EichbergerTimo Rahkonen
Published in: IEEE Trans. Instrum. Meas. (2016)
Keyphrases
  • automatic detection
  • thin film
  • artificial intelligence
  • feature selection
  • high impact