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Thermal analysis of InGaN/GaN (GaN substrate) laser diodes using transient interferometric mapping.
Sergey Bychikhin
T. Swietlik
Tadeusz Suski
S. Porowski
Piotr Perlin
Dionyz Pogany
Published in:
Microelectron. Reliab. (2007)
Keyphrases
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image segmentation
multiscale
statistical analysis
real time
information systems
image processing
mobile robot
structuring elements