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Etching-Based Measurement Error Compensation for Eddy Current Displacement Measurement.

Kalle KinnunenRaine Viitala
Published in: I2MTC (2024)
Keyphrases
  • measurement error
  • eddy current
  • magnetic field
  • range images
  • measurement errors
  • thin film
  • vanishing points
  • sample points
  • image processing
  • three dimensional
  • optical flow