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Improving Semiconductor Reliability with Advanced Engineering Methods in Test Program Development.
Stefan R. Vock
Omar Escalona
Colin Turner
Published in:
J. Electron. Test. (2015)
Keyphrases
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machine learning methods
artificial intelligence
preprocessing
software engineering
data sets
computational cost
benchmark datasets
qualitative and quantitative
social networks
case study
search algorithm
significant improvement
machine learning algorithms
engineering design
statistical tests