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Evaluation of impulse response-based BIST techniques for MEMS in the presence of weak nonlinearities.

Achraf DhayniSalvador MirLibor Rufer
Published in: ETS (2005)
Keyphrases
  • impulse response
  • standard deviation
  • frequency domain
  • computer vision
  • decision trees
  • multiscale
  • prior knowledge
  • frequency response