Processes of p-GaN Gate HEMTs for High-efficiency and High-reliability Applications.
Junting ChenChengcai WangZuoheng JiangMengyuan HuaPublished in: ASICON (2023)
Keyphrases
- high efficiency
- high reliability
- high precision
- low cost
- high accuracy
- real and synthetic datasets
- low overhead
- remote control
- density based clustering
- memory space
- arbitrary shape
- real time
- stochastic processes
- efficient implementation
- steady state
- wireless sensor networks
- multiscale
- neural network
- database
- multiple input