An efficient method to localize and correct bugs in high-level designs using counterexamples and potential dependence.
Takeshi MatsumotoShohei OnoMasahiro FujitaPublished in: VLSI-SoC (2012)
Keyphrases
- high level
- significant improvement
- pairwise
- high accuracy
- computational cost
- error rate
- support vector machine svm
- synthetic data
- cost function
- clustering method
- computationally efficient
- detection method
- video sequences
- objective function
- high precision
- data sets
- evaluation method
- optimization method
- input data
- experimental evaluation
- low level
- image processing
- genetic algorithm
- neural network