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Fabrication of AlGaN/GaN Fin-Type HEMT Using a Novel T-Gate Process for Improved Radio-Frequency Performance.
Min Su Cho
Jae Hwa Seo
Sang Ho Lee
Hwan Soo Jang
In Man Kang
Published in:
IEEE Access (2020)
Keyphrases
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radio frequency
low cost
similarity measure
multiscale