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Concurrent testing of VLSI circuits using conservative logic.

Gnanasekaran SwaminathanJames H. AylorBarry W. Johnson
Published in: ICCD (1990)
Keyphrases
  • vlsi circuits
  • low power
  • concurrent programs
  • logic programming
  • classical logic
  • test cases
  • asynchronous circuits
  • pattern recognition
  • digital images
  • high speed
  • power consumption
  • modal logic