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Coγ ray radiation on electrical properties of SiGe HBTs at low temperatures.

Yahui FengHongxia GuoWuying MaJiawen HuXiaoping OuyangJinxin ZhangFengqi ZhangHong ZhangRuxue BaiXiaohua MaYue Hao
Published in: Microelectron. J. (2024)
Keyphrases
  • electrical properties
  • x ray
  • infrared
  • thin film
  • dual channel
  • image sequences
  • high levels
  • ray tracing
  • film thickness