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Interval Simulated Annealing applied to Electrical Impedance Tomography image reconstruction with fast objective function evaluation.

Thiago de Castro MartinsMarcos de Sales Guerra TsuzukiErick Dario León Bueno de CamargoRaul Gonzalez LimaFernando Silva de MouraMarcelo Britto Passos Amato
Published in: Comput. Math. Appl. (2016)
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