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Performance Analysis in Digital Circuits for Process Corner Variations, Slew-Rate and Load Capacitance.

R. UdaiyakumarSenoj JosephT. V. P. SundararajanDhasarathan VigneswaranR. MaheswarIraj S. Amiri
Published in: Wirel. Pers. Commun. (2018)
Keyphrases
  • digital circuits
  • high speed
  • genetic algorithm
  • state space
  • design process
  • unit length