A BIST Scheme for Asynchronous Logic.

Vladimir Castro Alves Felipe M. G. França Edson do Prado Granja

Published in: Asian Test Symposium (1998)

Keyphrases

built in self test
asynchronous circuits
delay insensitive
real time
classification scheme
defeasible logic
database
image segmentation
computational complexity
logic programming
learning scheme
detection scheme
set theory
recognition scheme