Co-optimization of memory BIST grouping, test scheduling, and logic placement.
Andrew B. KahngIlgweon KangPublished in: DATE (2014)
Keyphrases
- built in self test
- integrated circuit
- scheduling problem
- optimization algorithm
- logic programming
- multiple objectives
- optimal placement
- memory space
- random access memory
- modal logic
- memory usage
- vehicle routing
- computing power
- constrained optimization
- scheduling algorithm
- global optimization
- dynamic optimization
- parallel processors
- optimization problems
- resource consumption
- perceptual grouping
- optimization model
- memory requirements
- main memory
- optimization method