Login / Signup
Instruction-Level NBTI Stress Estimation and Its Application in Runtime Aging Prediction for Embedded Processors.
Iraj Moghaddasi
Arash Fouman
Mostafa E. Salehi
Mehdi Kargahi
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2019)
Keyphrases
</>
embedded processors
prediction accuracy
single chip
wet lab
real time
parallel implementation