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Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models.

Changsoo HongLinda S. MilorMunkang ChoiTom Lin
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • integrated circuit
  • statistical models
  • computational models
  • prior knowledge
  • probabilistic model
  • neural network
  • software engineering
  • model selection
  • empirical studies
  • independent variables
  • positive effects