Algorithms for automatic test pattern generation.
Tom E. KirklandM. Ray MercerPublished in: IEEE Des. Test (1988)
Keyphrases
- learning algorithm
- optimization problems
- times faster
- orders of magnitude
- data structure
- computationally efficient
- recently developed
- computational cost
- semi automatic
- computationally expensive
- databases
- social networks
- theoretical analysis
- highly efficient
- real time
- graph theory
- fully automatic
- classification algorithm
- benchmark datasets
- multi agent
- website
- data sets