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Current imaging, EBIC/EBAC, and electrical probing combined for fast and reliable in situ electrical fault isolation.

Stephan KleindiekKlaus SchockAndreas RummelMichael ZschornackPascal LimbeckerAndreas MeyerMatthias Kemmler
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • fault isolation
  • expert systems
  • diagnostic tests
  • genetic algorithm
  • web applications
  • distributed systems
  • life cycle