Transistor-Level Fault Analysis and Test Algorithm Development for Ternary Dynamic Content Addressable Memorie.
Derek WrightManoj SachdevPublished in: ITC (2003)
Keyphrases
- learning algorithm
- computational complexity
- preprocessing
- dynamic programming
- recognition algorithm
- optimization algorithm
- simulated annealing
- optimal solution
- cost function
- probabilistic model
- matching algorithm
- genetic algorithm
- expert systems
- computational cost
- software engineering
- expectation maximization
- dynamic environments
- segmentation algorithm
- image segmentation
- information sharing
- convergence rate