Guiding Circuit Level Fault-Tolerance Design with Statistical Methods.
Drew C. NessDavid J. LiljaPublished in: DATE (2008)
Keyphrases
- fault tolerance
- statistical methods
- fault tolerant
- statistical analysis
- response time
- circuit design
- statistical approaches
- machine learning
- computational methods
- distributed systems
- distributed computing
- error detection
- replicated databases
- statistical models
- biological data
- knowledge based systems
- data mining techniques
- higher order
- data analysis
- multimedia
- database
- mobile agent system
- fault management