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A Systematic Study of the Prediction Model for Operator-Induced Assembly Defects Based on Assembly Complexity Factors.

Qiang SuLei LiuDaniel E. Whitney
Published in: IEEE Trans. Syst. Man Cybern. Part A (2010)
Keyphrases
  • prediction model
  • factors that influence
  • factors that affect
  • regression model
  • factors affecting
  • printed circuit boards
  • prior studies
  • decision trees
  • computational complexity
  • factors affect