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A posteriori error analysis for the conical diffraction problem.

Zhoufeng WangYunzhang Zhang
Published in: Comput. Math. Appl. (2017)
Keyphrases
  • error analysis
  • x ray
  • signal processing
  • least squares
  • cross ratio
  • transmission electron microscopy
  • error correction
  • electron microscope
  • pattern recognition
  • three dimensional
  • maximum likelihood
  • infrared