Understanding Important Features of Deep Learning Models for Transmission Electron Microscopy Image Segmentation.
James P. HorwathDmitri N. ZakharovRémi MégretEric A. StachPublished in: CoRR (2019)
Keyphrases
- learning models
- image segmentation
- machine learning models
- loss function
- classification models
- machine learning
- learning algorithm
- learning tasks
- graph cuts
- semi supervised learning
- transmission electron microscopy
- learning problems
- markov random field
- machine learning algorithms
- conditional random fields
- feature vectors
- decision trees
- image processing
- energy function
- x ray