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Verification of analytic point defect models using SUPREM-IV [dopant diffusion].
Mark E. Law
Robert W. Dutton
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1988)
Keyphrases
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probabilistic model
complex systems
experimental data
data sets
machine learning
genetic algorithm
feature selection
optical flow
statistical models
parametric models
sample points
accurate models
diffusion models