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You Better Look Twice: a new perspective for designing accurate detectors with reduced computations.
Alexandra Dana
Maor Shutman
Yotam Perlitz
Ran Vitek
Tomer Peleg
Roy J. Jevnisek
Published in:
BMVC (2021)
Keyphrases
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object detection
data sets
high accuracy
image segmentation
high quality
computationally efficient
machine learning
database systems
data structure
probabilistic model
image features
motion estimation
highly accurate
low error