Login / Signup
Degradation induced by holes in Si3N4/AlGaN/GaN MIS HEMTs under off-state stress with UV light.
Yilin Chen
Qing Zhu
Jie-Jie Zhu
Minhan Mi
Meng Zhang
Yuwei Zhou
Ziyue Zhao
Xiaohua Ma
Yue Hao
Published in:
Sci. China Inf. Sci. (2023)
Keyphrases
</>
databases
state space
database
database systems
color images
image restoration
management information systems