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Degradation induced by holes in Si3N4/AlGaN/GaN MIS HEMTs under off-state stress with UV light.

Yilin ChenQing ZhuJie-Jie ZhuMinhan MiMeng ZhangYuwei ZhouZiyue ZhaoXiaohua MaYue Hao
Published in: Sci. China Inf. Sci. (2023)
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