Layer Embedding Analysis in Convolutional Neural Networks for Improved Probability Calibration and Classification.
Fan ZhangNicha C. DvornekJunlin YangJulius ChapiroJim DuncanPublished in: IEEE Trans. Medical Imaging (2020)
Keyphrases
- pattern recognition
- training samples
- decision trees
- machine learning
- feature extraction
- support vector
- probability distribution
- pattern classification
- automatic classification
- classification scheme
- feature selection
- computer vision
- convolutional neural networks
- image analysis
- multi layer
- vector space
- error analysis
- class labels
- model selection
- classification accuracy
- data sets
- training set
- feature space
- multiscale
- learning algorithm
- neural network