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Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultralow Power Processors.

Loris DuchMiguel Peón QuirósPieter WeckxAlexandre LevisseRubén BraojosFrancky CatthoorDavid Atienza
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2020)
Keyphrases
  • long term
  • data analysis
  • artificial intelligence
  • image analysis
  • short term
  • machine learning
  • computer vision
  • parallel algorithm
  • parallel processing