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Low cost soft error hardened latch designs for nano-scale CMOS technology in presence of process variation.

Ramin RajaeiMahmoud TabandehMahdi Fazeli
Published in: Microelectron. Reliab. (2013)
Keyphrases
  • low power
  • low cost
  • nano scale
  • cmos technology
  • power consumption
  • hidden markov models
  • high speed