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Parallelization methods for circuit partitioning based parallel automatic test pattern generation.

Robert H. KlenkeRonald D. WilliamsJames H. Aylor
Published in: VTS (1993)
Keyphrases
  • machine learning methods
  • parallel processing
  • face recognition
  • empirical studies
  • database
  • neural network
  • information retrieval
  • similarity measure
  • search algorithm
  • high speed
  • benchmark datasets