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Accurate numerical models for simulation of radiation events in nano-scale semiconductor devices.
Alexander I. Fedoseyev
Marek Turowski
Michael L. Alles
Robert A. Weller
Published in:
Math. Comput. Simul. (2008)
Keyphrases
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nano scale
accurate models
neural network
probabilistic model
simulation models
complex systems
experimental data
event detection
mathematical models
analytical model
high fidelity
mathematical analysis
finite difference
semiconductor devices