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Radiation-induced shallow trench isolation leakage in 180-nm flash memory technology.
Bingxu Ning
Zhengxuan Zhang
Zhangli Liu
Zhiyuan Hu
Ming Chen
Dawei Bi
Shichang Zou
Published in:
Microelectron. Reliab. (2012)
Keyphrases
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flash memory
garbage collection
solid state
storage devices
disk drives
buffer management
embedded systems
main memory
case study
query processing
computer systems
x ray
data storage
random access
hand held devices
storage systems
database management systems
data sources
database systems