Deep Learning Based Diagnostics for Rowhammer Protection of DRAM Chips.

Anirban Chakraborty Manaar Alam Debdeep Mukhopadhyay

Published in: ATS (2019)

Keyphrases

deep learning
high density
unsupervised learning
unsupervised feature learning
machine learning
integrated circuit
mental models
weakly supervised
deep architectures
deep belief networks
restricted boltzmann machine
training data
d objects
supervised learning