Prognostics-Based LED Qualification Using Similarity-Based Statistical Measure With RVM Regression Model.
Moon-Hwan ChangMyeongsu KangMichael G. PechtPublished in: IEEE Trans. Ind. Electron. (2017)
Keyphrases
- regression model
- multivariate regression
- generalized linear models
- model selection
- prediction model
- regression analysis
- linear regression model
- linear model
- regression methods
- interval valued data
- independent variables
- support vector regression
- generalized linear
- explanatory variables
- logistic regression
- prediction intervals
- regression method
- chi square
- gaussian process
- relevance vector machines
- software effort
- statistical analysis
- kernel regression
- survival analysis
- statistical inference
- regression trees
- linear regression models
- neural network
- multiple linear regression
- locally weighted
- logistic regression models
- statistical methods