Non-parametric distance-based classification techniques and their applications.

Filiberto Pla Petia Radeva Jordi Vitrià

Published in: Pattern Anal. Appl. (2008)

Keyphrases

distance measure
euclidean distance
outlier detection
gaussian process
data mining
neural network
model selection
probability density function
semi parametric
statistical dependence
database
data sets
image segmentation
optimal solution
gaussian processes
kernel density estimation