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SRAM Operational Mismatch Corner Model for Efficient Circuit Design and Yield Analysis.
Tae Hoon Choi
Hanwool Jeong
Younghwi Yang
Juhyun Park
Seong-Ook Jung
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2017)
Keyphrases
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mathematical model
probabilistic model
computational model
probability distribution
management system
genetic algorithm
objective function
statistical model
conceptual model
formal model
statistical analysis
theoretical analysis
empirical data
neural model
circuit design