Fabric Defect Detection With Deep Learning and False Negative Reduction.
Tomás AlmeidaFilipe MoutinhoJoão Pedro Matos-CarvalhoPublished in: IEEE Access (2021)
Keyphrases
- deep learning
- false negative
- false positives
- false negative rate
- unsupervised feature learning
- unsupervised learning
- low false positive rate
- false positive rate
- machine learning
- mental models
- weakly supervised
- detection rate
- deep architectures
- restricted boltzmann machine
- pattern recognition
- bayesian networks
- decision trees