Sequential Cycloid Scanning for Time-resolved Atomic Force Microscopy.

Nastaran Nikooienejad Afshin Alipour Mohammad Maroufi S. O. Reza Moheimani

Published in: AIM (2018)

Keyphrases

atomic force microscopy
scan data
image processing
search engine
structured light
neural network
machine learning
information systems
image segmentation
image sequences
feature extraction